Issued Patents All Time
Showing 25 most recent of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8201132 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, Daniel N. Maynard, Michael E. Scaman, Shi Zhong | 2012-06-12 |
| 7709967 | Shapes-based migration of aluminum designs to copper damascene | Timothy G. Dunham, Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin | 2010-05-04 |
| 7685544 | Testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, Daniel N. Maynard, Michael E. Scaman, Shi Zhong | 2010-03-23 |
| 7669159 | IC tiling pattern method, IC so formed and analysis method | Robert J. Allen, John M. Cohn, Peter A. Habitz, Ivan L. Wemple, Paul S. Zuchowski | 2010-02-23 |
| 7584077 | Physical design characterization system | Betty L. Bergman Reuter, Mitchell R. DeHond, Daniel N. Maynard, Brian D. Pfeifer, David C. Reynolds +1 more | 2009-09-01 |
| 7552417 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, Daniel N. Maynard, Maharaj Mukherjee | 2009-06-23 |
| 7498250 | Shapes-based migration of aluminum designs to copper damascene | Timothy G. Dunham, Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin | 2009-03-03 |
| 7492941 | Mask defect analysis system | James A. Bruce, Orest Bula, Edward W. Conrad, Michael S. Hibbs, Joshua J. Krueger | 2009-02-17 |
| 7492940 | Mask defect analysis system | James A. Bruce, Orest Bula, Edward W. Conrad, Michael S. Hibbs, Joshua J. Krueger | 2009-02-17 |
| 7415695 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, Daniel N. Maynard, Maharaj Mukherjee | 2008-08-19 |
| 7404174 | method for generating a set of test patterns for an optical proximity correction algorithm | David L. DeMaris, Mark A. Lavin, Daniel N. Maynard, Maharaj Mukherjee | 2008-07-22 |
| 7353472 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, Daniel N. Maynard, Michael E. Scaman, Shi Zhong | 2008-04-01 |
| 7312141 | Shapes-based migration of aluminum designs to copper damascene | Timothy G. Dunham, Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin | 2007-12-25 |
| 7284230 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, Daniel N. Maynard, Maharaj Mukherjee | 2007-10-16 |
| 7257247 | Mask defect analysis system | James A. Bruce, Orest Bula, Edward W. Conrad, Michael S. Hibbs, Joshua J. Krueger | 2007-08-14 |
| 7051307 | Autonomic graphical partitioning | Gary S. Ditlow, Daria R. Dooling, Timothy G. Dunham, Stephen D. Thomas, Ralph J. Williams | 2006-05-23 |
| 6992002 | Shapes-based migration of aluminum designs to copper damascence | Timothy G. Dunham, Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin | 2006-01-31 |
| 6948146 | Simplified tiling pattern method | Robert J. Allen, John M. Cohn, Peter A. Habitz, Ivan L. Wemple, Paul S. Zuchowski | 2005-09-20 |
| 6823496 | Physical design characterization system | Bette L. Bergman Reuter, Mitchell R. DeHond, Daniel N. Maynard, Brian D. Pfeifer, David C. Reynolds +1 more | 2004-11-23 |
| 6760901 | Trough adjusted optical proximity correction for vias | Bette L. Bergman Reuter, Eric M. Coker | 2004-07-06 |
| 6704695 | Interactive optical proximity correction design method | Orest Bula, Daniel C. Cole, Edward W. Conrad | 2004-03-09 |
| 6667136 | Method to control nested to isolated line printing | Orest Bula, Daniel C. Cole, Edward W. Conrad | 2003-12-23 |
| 6662350 | FinFET layout generation | David M. Fried, Edward J. Nowak | 2003-12-09 |
| 6539321 | Method for edge bias correction of topography-induced linewidth variation | James A. Bruce, Orest Bula, Edward W. Conrad | 2003-03-25 |
| 6528883 | Shapes-based migration of aluminum designs to copper damascene | Timothy G. Dunham, Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin | 2003-03-04 |