Issued Patents All Time
Showing 1–25 of 49 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372520 | Reverse performance binning | Mark W. Kuemerle | 2016-06-21 |
| 9104832 | Identifying and mitigating electromigration failures in signal nets of an integrated circuit chip design | John E. Barwin, Jason Chung, Amol A. Joshi, William J. Livingstone, Leon Sigal +1 more | 2015-08-11 |
| 8589843 | Method and device for selectively adding timing margin in an integrated circuit | David E. Lackey, Chandramouili Visweswariah | 2013-11-19 |
| 8504971 | Method and device for selectively adding timing margin in an integrated circuit | David E. Lackey, Chandramouili Visweswariah | 2013-08-06 |
| 8490045 | Method and device for selectively adding timing margin in an integrated circuit | David E. Lackey, Chandramouili Visweswariah | 2013-07-16 |
| 8122409 | Method and device for selectively adding timing margin in an integrated circuit | David E. Lackey, Chandramouli Visweswariah | 2012-02-21 |
| 8122165 | On-demand power supply current modification system and method for an integrated circuit | Corey K. Barrows, Kenneth J. Goodnow, Stephen G. Shuma, Peter A. Twombly | 2012-02-21 |
| 8020137 | Structure for an on-demand power supply current modification system for an integrated circuit | Corey K. Barrows, Kenneth J. Goodnow, Stephen G. Shuma, Peter A. Twombly | 2011-09-13 |
| 8010813 | Structure for system for extending the useful life of another system | Kenneth J. Goodnow, Stephen G. Shuma, Oscar C. Strohacker, Mark S. Styduhar, Peter A. Twombly +1 more | 2011-08-30 |
| 7961932 | Method and apparatus for manufacturing diamond shaped chips | Robert J. Allen, John M. Cohn, Scott Whitney Gould, Peter A. Habitz, Juergen Koehl +2 more | 2011-06-14 |
| 7949978 | Structure for system architectures for and methods of scheduling on-chip and across-chip noise events in an integrated circuit | Corey K. Barrows, Kenneth J. Goodnow, Stephen G. Shuma, Peter A. Twombly | 2011-05-24 |
| 7849426 | Mechanism for detection and compensation of NBTI induced threshold degradation | Kenneth J. Goodnow, Douglas W. Kemerer, Stephen G. Shuma, Oscar C. Strohacker, Mark S. Styduhar +1 more | 2010-12-07 |
| 7793163 | Method and system for extending the useful life of another system | Kenneth J. Goodnow, Stephen G. Shuma, Oscar C. Strohacker, Mark S. Styduhar, Peter A. Twombly +1 more | 2010-09-07 |
| 7793251 | Method for increasing the manufacturing yield of programmable logic devices | Kenneth J. Goodnow, Clarence R. Ogilvie, Christopher B. Reynolds, Sebastian T. Ventrone | 2010-09-07 |
| 7759960 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2010-07-20 |
| 7696811 | Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Corey K. Barrows, Douglas W. Kemerer, Stephen G. Shuma, Douglas W. Stout, Oscar C. Strohacker +1 more | 2010-04-13 |
| 7671666 | Methods to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Corey K. Barrows, Douglas W. Kemerer, Stephen G. Shuma, Douglas W. Stout, Oscar C. Strohacker +1 more | 2010-03-02 |
| 7669159 | IC tiling pattern method, IC so formed and analysis method | Robert J. Allen, John M. Cohn, Peter A. Habitz, William C. Leipold, Ivan L. Wemple | 2010-02-23 |
| 7644327 | System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded FPGA | John M. Cohn, Christopher B. Reynolds, Sebastian T. Ventrone | 2010-01-05 |
| 7564256 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2009-07-21 |
| 7545165 | System architectures for and methods of scheduling on-chip and across-chip noise events in an integrated circuit | Corey K. Barrows, Kenneth J. Goodnow, Stephen G. Shuma, Peter A. Twombly | 2009-06-09 |
| 7486098 | Integrated circuit testing method using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2009-02-03 |
| 7459958 | Circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Corey K. Barrows, Douglas W. Kemerer, Stephen G. Shuma, Douglas W. Stout, Oscar C. Strohacker +1 more | 2008-12-02 |
| 7437620 | Method and system for extending the useful life of another system | Kenneth J. Goodnow, Stephen G. Shuma, Oscar C. Strohacker, Mark S. Styduhar, Peter A. Twombly +1 more | 2008-10-14 |
| 7428675 | Testing using independently controllable voltage islands | Anne Elizabeth Gattiker, Phil Nigh, Leah Pastel, Steven F. Oakland, Jody VanHorn | 2008-09-23 |