Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7428675 | Testing using independently controllable voltage islands | Anne Elizabeth Gattiker, Phil Nigh, Leah Pastel, Steven F. Oakland, Paul S. Zuchowski | 2008-09-23 |
| 5923181 | Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module | Kenneth E. Beilstein, Jr., Claude L. Bertin, Dennis Charles Dubois, Wayne J. Howell, Gordon A. Kelley, Jr. +4 more | 1999-07-13 |
| 5686843 | Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module | Kenneth E. Beilstein, Jr., Claude L. Bertin, Dennis Charles Dubois, Wayne J. Howell, Gordon A. Kelley, Jr. +4 more | 1997-11-11 |