Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5923181 | Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module | Kenneth E. Beilstein, Jr., Claude L. Bertin, Wayne J. Howell, Gordon A. Kelley, Jr., Christopher P. Miller +4 more | 1999-07-13 |
| 5686843 | Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module | Kenneth E. Beilstein, Jr., Claude L. Bertin, Wayne J. Howell, Gordon A. Kelley, Jr., Christopher P. Miller +4 more | 1997-11-11 |