Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10739276 | Minimizing filed size to reduce unwanted stray light | Donald Pettibone, Daniel Kavaldjiev, Qing Li, Frank Li, Zhiwei Xu | 2020-08-11 |
| 10324045 | Surface defect inspection with large particle monitoring and laser power control | Steve (Yifeng) Cui, Chunsheng Huang, Chunhai Wang, Christian Wolters, Bret Whiteside +2 more | 2019-06-18 |
| 10088345 | Haze and defect distribution and aperture configuration in surface metrology inspectors | Raymond Chu, Gordana Neskovic, Dieter Wilk, Christian Wolters, Tim Mahatdejkul | 2018-10-02 |
| 9970873 | System and method for luminescent tag based wafer inspection | Donald Pettibone, Kurt L. Haller | 2018-05-15 |
| 9726615 | System and method for simultaneous dark field and phase contrast inspection | Qing Li, Donald Pettibone, Buzz Graves | 2017-08-08 |