DP

Donald Pettibone

KL Kla-Tencor: 10 patents #162 of 1,394Top 15%
KL Kla: 4 patents #87 of 758Top 15%
QU Quadlux: 4 patents #4 of 18Top 25%
RH Resonex Holding: 1 patents #9 of 36Top 25%
UF US Air Force: 1 patents #6,190 of 16,312Top 40%
📍 San Jose, CA: #3,255 of 32,062 inventorsTop 15%
🗺 California: #28,827 of 386,348 inventorsTop 8%
Overall (All Time): #220,406 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11415725 System, method and apparatus for polarization control Ivan Maleev 2022-08-16
11302590 Delivery of light into a vacuum chamber using an optical fiber Emanuel Saerchen, Oscar G. Florendo, Li-Min Chen, Martin Brutsch 2022-04-12
11170971 Multiple working distance height sensor using multiple wavelengths 2021-11-09
10921488 System, method and apparatus for polarization control Ivan Maleev 2021-02-16
10739276 Minimizing filed size to reduce unwanted stray light Daniel Kavaldjiev, Chuanyong Huang, Qing Li, Frank Li, Zhiwei Xu 2020-08-11
10462391 Dark-field inspection using a low-noise sensor Yung-Ho Alex Chuang, David L. Brown, Devis Contarato, John Fielden, Daniel Kavaldjiev +4 more 2019-10-29
10324045 Surface defect inspection with large particle monitoring and laser power control Steve (Yifeng) Cui, Chunsheng Huang, Chunhai Wang, Christian Wolters, Bret Whiteside +2 more 2019-06-18
9995850 System, method and apparatus for polarization control Ivan Maleev 2018-06-12
9970873 System and method for luminescent tag based wafer inspection Chuanyong Huang, Kurt L. Haller 2018-05-15
9891177 TDI sensor in a darkfield system Jijen Vazhaeparambil, Guoheng Zhao, Daniel Kavaldjiev, Anatoly Romanovsky, Ivan Maleev +5 more 2018-02-13
9747670 Method and system for improving wafer surface inspection sensitivity 2017-08-29
9726615 System and method for simultaneous dark field and phase contrast inspection Chuanyong Huang, Qing Li, Buzz Graves 2017-08-08
6727512 Method and system for detecting phase defects in lithographic masks and semiconductor wafers Stan Stokowski, Damon F. Kvamme, Chun-Shen Lee 2004-04-27
6646281 Differential detector coupled with defocus for improved phase defect sensitivity Matthias C. Krantz, Damon F. Kvamme, Stan Stokowski 2003-11-11
6013900 High efficiency lightwave oven Eugene R. Westerberg 2000-01-11
5990454 Lightwave oven and method of cooking therewith having multiple cook modes and sequential lamp operation Eugene R. Westerberg, Gay Winterringer 1999-11-23
5958271 Lightwave oven and method of cooking therewith with cookware reflectivity compensation Eugene R. Westerberg 1999-09-28
5883362 Apparatus and method for regulating cooking time in a lightwave oven John W. O'Neal, Gay Winterringer 1999-03-16
4882540 Magnetic resonance imaging (MRI)apparatus with quadrature radio frequency (RF) coils Robert Domenick, Phillip Foreman, David M. Parish 1989-11-21
4523293 Two-dimensional bulk acoustic wave correlator-convolver Bert A. Auld, James D. Plummer 1985-06-11