LG

Lee K. Galbraith

TI Tencor Instruments: 7 patents #4 of 50Top 8%
UE US Dept of Energy: 1 patents #1,355 of 5,099Top 30%
Overall (All Time): #668,199 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5604585 Particle detection system employing a subsystem for collecting scattered light from the particles Ralph Johnson, Keith Wells 1997-02-18
5276498 Adaptive spatial filter for surface inspection John L. Vaught, Ralph C. Wolf, Brian C. Leslie, Armand P. Neukermans 1994-01-04
5168386 Flat field telecentric scanner 1992-12-01
4601576 Light collector for optical contaminant and flaw detector 1986-07-22
4597665 Dual collector optical flaw detector Karel Urbanek 1986-07-01
4512659 Apparatus for calibrating a surface scanner Jiri Pecen 1985-04-23
4378159 Scanning contaminant and defect detector 1983-03-29
4282429 Flash protection controller 1981-08-04