Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D1088956 | Golf cart | Xiaomin Xie, Qiang Chen | 2025-08-19 |
| 12381064 | Architecture for large active area high speed detector | Yongxin Wang, Rui-Ling Lai | 2025-08-05 |
| D1067178 | Portable power station | Xiaomin Xie, Qiang Chen, Jinheng He, Min Xiong | 2025-03-18 |
| 12205792 | Semiconductor charged particle detector for microscopy | Yongxin Wang, Rui-Ling Lai, Kenichi Kanai | 2025-01-21 |
| 12080513 | Cross-talk cancellation in multiple charged-particle beam inspection | Wei Fang, Lingling PU, Bo Wang, Yongxin Wang | 2024-09-03 |
| D1036300 | Golf cart | — | 2024-07-23 |
| D1036301 | Golf cart | Xiaomin Xie, Jinheng He | 2024-07-23 |
| 11942304 | Field programmable detector array | Yongxin Wang, Rui-Ling Lai | 2024-03-26 |
| 11862427 | Switch matrix design for beam image system | Yongxin Wang, Rui-Ling Lai | 2024-01-02 |
| 11815473 | Methods of inspecting samples with multiple beams of charged particles | Kuo-Feng TSENG, Yixiang Wang, Zhong-Wei Chen | 2023-11-14 |
| 11715619 | Method and apparatus for charged particle detection | Yongxin Wang, Weiming Ren, Zhongwei Chen | 2023-08-01 |
| D987556 | Power station | — | 2023-05-30 |
| 11594395 | Pixel shape and section shape selection for large active area high speed detector | Yongxin Wang | 2023-02-28 |
| 11508547 | Semiconductor charged particle detector for microscopy | Yongxin Wang, Rui-Ling Lai, Kenichi Kanai | 2022-11-22 |
| 11476085 | Switch matrix design for beam image system | Yongxin Wang, Rui-Ling Lai | 2022-10-18 |
| 11430629 | Field programmable detector array | Yongxin Wang, Rui-Ling Lai | 2022-08-30 |
| 11295930 | Method and apparatus for charged particle detection | Yongxin Wang, Weiming Ren, Zhongwei Chen | 2022-04-05 |
| 11175248 | Apparatus and method for detecting time-dependent defects in a fast-charging device | Long Ma, Chih-Yu JEN, Peilei Zhang, Wei Fang, Chuan Li | 2021-11-16 |
| D802530 | Portable power supply | Gregory Adams, Xiaofei Zhou | 2017-11-14 |
| 9601311 | Laser SDE effect compensation by adaptive tuning | Ying Luo, KuoFeng Tseng | 2017-03-21 |
| 9330987 | Hot spot identification, inspection, and review | Steve Lin, Wei FANG, Eric Ma, Jon Yee Chiang, Yan Zhao +2 more | 2016-05-03 |
| 8519333 | Charged particle system for reticle/wafer defects inspection and review | Chiyan Kuan, Yi Wang, Chung-Shih Pan, Zhongwei Chen | 2013-08-27 |
| 7705298 | System and method to determine focus parameters during an electron beam inspection | Xuedong Liu, Wei FANG, Zhong-Wei Chen | 2010-04-27 |