Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
YZ

Yan Zhao — 15 Patents

FIFinisar: 5 patents #151 of 719Top 25%
Applied Materials: 2 patents #3,641 of 7,310Top 50%
CSCadence Design Systems: 1 patents #1,216 of 2,263Top 55%
CPChina Petrochemical: 1 patents #103 of 418Top 25%
IDIi-Vi Delaware: 1 patents #222 of 394Top 60%
SASamtec: 1 patents #83 of 128Top 65%
Fremont, CA: #1,160 of 9,298 inventorsTop 15%
California: #40,325 of 386,348 inventorsTop 15%
Overall (All Time): #306,168 of 4,157,543Top 8%
15 Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12243840 Wirebondable interposer for flip chip packaged integrated circuit die Edwin Loy, Chihhao Chen 2025-03-04
11980992 Integrated abrasive polishing pads and manufacturing methods Ashavani Kumar, Ashwin CHOCKALINGAM, Sivapackia Ganapathiappan, Rajeev Bajaj, Boyi Fu +6 more 2024-05-14
11471999 Integrated abrasive polishing pads and manufacturing methods Ashavani Kumar, Ashwin CHOCKALINGAM, Sivapackia Ganapathiappan, Rajeev Bajaj, Boyi Fu +6 more 2022-10-18
10845553 Multichannel RF feedthroughs Bernd Huebner, Tengda Du, Yuheng Lee 2020-11-24
10140410 Representing a routing strip in an integrated circuit design using a digit pattern An-Chi Liu, Xiang Gao, Ming Jin Chen 2018-11-27
9900974 Flex-less multilayer ceramic substrate Wenhua Ling, Yongsheng Liu, Yuheng Lee 2018-02-20
9538637 Multichannel RF feedthroughs Bernd Huebner, Tengda Du, Yuheng Lee 2017-01-03
9330987 Hot spot identification, inspection, and review Steve Lin, Wei FANG, Eric Ma, Zhonghua Dong, Jon Yee Chiang +2 more 2016-05-03
7978030 High-speed interconnects Yuheng Lee, Jianying Zhou, Christopher R. Cole, Bernd Huebner 2011-07-12
7880570 Feed thru with flipped signal plane using guided vias Jianying Zhou, Yuheng Lee, Bernd Huebner 2011-02-01
7859367 Non-coplanar high-speed interconnects Yuheng Lee, Jianying Zhou 2010-12-28
7474001 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturing Chang-Chun Yeh, Zhong-Wei Chen, Jack Jau 2009-01-06
7105436 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturing Chang-Chun Yeh, Zhong-Wei Chen, Jack Jau 2006-09-12
6815345 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturing Chang-Chun Yeh, Zhongwei Chen, Jack Jau 2004-11-09
5286692 Mild hydrocracking catlyst and the process therefor Yuduo Hou, Quanzhu Peng, Jiduan Liu, Xiaogang Chen 1994-02-15