Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11651935 | Time-dependent defect inspection apparatus | Long Ma, Yongjun Wang, Jun Jiang | 2023-05-16 |
| 11175248 | Apparatus and method for detecting time-dependent defects in a fast-charging device | Long Ma, Zhonghua Dong, Peilei Zhang, Wei Fang, Chuan Li | 2021-11-16 |
| 11056311 | Time-dependent defect inspection apparatus | Long Ma, Yongjun Wang, Jun Jiang | 2021-07-06 |
| 9599555 | Doping profile measurement using terahertz time domain spectroscopy (THz-TDS) | Christiaan Richter | 2017-03-21 |