Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6570154 | Scanning electron beam microscope | Douglas K. Masnaghetti, Stanley Sun, Waiman Ng, David L. Adler | 2003-05-27 |
| 6211518 | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Neil Richardson, Farid Askary, Kevin M. Monahan, David L. Adler | 2001-04-03 |
| 6066849 | Scanning electron beam microscope | Douglas K. Masnaghetti, Stanley Sun, Waiman Ng, David L. Adler | 2000-05-23 |
| 5869833 | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Neil Richardson, Farid Askary, Kevin M. Monahan, David L. Adler | 1999-02-09 |
| 5127064 | High resolution image compression methods and apparatus | Xavier A. Flinois | 1992-06-30 |
| 5054097 | Methods and apparatus for alignment of images | Xavier A. Flinois | 1991-10-01 |