Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11322333 | Charged particle detection system | Eli Cheifetz, Armin Schon | 2022-05-03 |
| 11031210 | Charged particle detection system | Eli Cheifetz, Armin Schon | 2021-06-08 |
| 10910193 | Particle detection assembly, system and method | Eli Cheifetz, Amit Weingarten, Semyon Shopman, Silviu Reinhorn | 2021-02-02 |
| 9442369 | Method and apparatus for lithographic mask production | Joel Seligson | 2016-09-13 |
| 9214317 | System and method of SEM overlay metrology | — | 2015-12-15 |
| 8546756 | System and method for material analysis of a microscopic element | Yaron Cohen | 2013-10-01 |
| 7602197 | High current electron beam inspection | Alexander Kadyshevitch, Christopher G. Talbot | 2009-10-13 |
| 7476875 | Contact opening metrology | Alexander Kadyshevitch, Chris Talbot, Andreas Hegedus | 2009-01-13 |
| 7473911 | Specimen current mapper | Alexander Kadyshevitch, Dror Shemesh, Yaniv Brami | 2009-01-06 |
| 7381978 | Contact opening metrology | Alexander Kadyshevitch, Chris Talbot, Andreas Hegedus | 2008-06-03 |
| 7279689 | Contact opening metrology | Alexander Kadyshevitch, Chris Talbot, Andreas Hegedus | 2007-10-09 |
| 7038224 | Contact opening metrology | Alexander Kadyshevitch, Chris Talbot, Andreas Hegedus | 2006-05-02 |