Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7761182 | Automatic defect repair system | Steven Barnes, Lakshman Srinivasan, Wayne Wang | 2010-07-20 |
| 7065239 | Automated repetitive array microstructure defect inspection | Kais Maayah, Lakshman Srinivasan, Richard Barnard, Jun Liu | 2006-06-20 |
| 6539106 | Feature-based defect detection | Chiwoei Wayne Lo, Adam Rhoads, Christopher G. Talbot | 2003-03-25 |