Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7761182 | Automatic defect repair system | Harry Gallarda, Steven Barnes, Wayne Wang | 2010-07-20 |
| 7065239 | Automated repetitive array microstructure defect inspection | Kais Maayah, Harry Gallarda, Richard Barnard, Jun Liu | 2006-06-20 |
| 5808735 | Method for characterizing defects on semiconductor wafers | Ken Kinsun Lee, Ke Han, Bruce W. Worster | 1998-09-15 |
| 5798830 | Method of establishing thresholds for image comparison | — | 1998-08-25 |