Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8204296 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Santosh Bhattacharyya, Ardis Liang, Richard Wallingford +1 more | 2012-06-19 |
| 8139843 | Methods and systems for utilizing design data in combination with inspection data | Ashok Kulkarni, Brian Duffy, Gordon Rouse | 2012-03-20 |
| 8041103 | Methods and systems for determining a position of inspection data in design data space | Ashok Kulkarni, Brian Duffy, Gordon Rouse, Eugene Shifrin | 2011-10-18 |
| 7796804 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Santosh Bhattacharyya, Ardis Liang, Richard Wallingford +1 more | 2010-09-14 |
| 7676077 | Methods and systems for utilizing design data in combination with inspection data | Ashok Kulkarni, Brian Duffy, Gordon Rouse | 2010-03-09 |
| 7065239 | Automated repetitive array microstructure defect inspection | Harry Gallarda, Lakshman Srinivasan, Richard Barnard, Jun Liu | 2006-06-20 |