Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6539106 | Feature-based defect detection | Harry Gallarda, Chiwoei Wayne Lo, Christopher G. Talbot | 2003-03-25 |
| 5214492 | Apparatus for producing an accurately aligned aperture of selectable diameter | Robert T. LoBianco, Thomas E Clawges | 1993-05-25 |