Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366525 | Phase retrieval | Benny Kirshner | 2025-07-22 |
| 12092584 | High throughput defect detection | — | 2024-09-17 |
| 11448601 | Method and system for obtaining information from a sample | Roman Naidis | 2022-09-20 |
| 10481101 | Asymmetrical magnification inspection system and illumination module | Haim Feldman, Ido Dolev | 2019-11-19 |
| 10177048 | System for inspecting and reviewing a sample | Juergen Frosien, Jacob Levin, Igor Krivts (Krayvitz), Yoram Uziel | 2019-01-08 |
| 10054551 | Inspection system and method for inspecting a sample by using a plurality of spaced apart beams | Ron Naftali | 2018-08-21 |
| 9958670 | Scanning system and method for scanning an object | Ron Naftail, Rami Elichai | 2018-05-01 |
| 9395266 | On-tool wavefront aberrations measurement system and method | Amir Sagiv, Haim Feldman, Uriel Malul, Adam Baer | 2016-07-19 |
| 7403336 | Broadband imaging system and method | Benjamin Cohen | 2008-07-22 |
| 7315364 | System for inspecting a surface employing configurable multi angle illumination modes | Adam Baer | 2008-01-01 |
| 7053395 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Silviu Reinhorn | 2006-05-30 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Silviu Reinhorn | 2005-02-08 |
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Silviu Reinhorn | 2004-10-26 |
| 6750436 | Focus error detection apparatus and method having dual focus error detection path | Haim Feldman, Alexander Libinson | 2004-06-15 |
| 6469784 | Optical inspection method and apparatus utilizing a variable angle design | Amir Komem, Ron Naftali, Gilad Almogy | 2002-10-22 |
| 4502310 | Conveyor roller and method of manufacture thereof | Anatoly N. Gnutov, Nadezhda N. Zelenskaya, Vladimir G. Kaporovich, Vladimir V. Kaporovich, Varlen K. Pirogov +5 more | 1985-03-05 |
| 4470281 | Method of forming end face wall having concentric recess in tubular workpiece | Vladimir G. Kaporovich, Viktor G. Sereda, Valentina P. Chemeris, Vladimir V. Kaporovich, Viktor A. Makarychev +4 more | 1984-09-11 |