Emanuel Elyasaf — 19 Patents at Applied Materials

Emanuel Elyasaf has been granted 19 US patents while listed as an inventor at Applied Materials. The first was granted in 1999 and the most recent in July 2017. Emanuel Elyasaf ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Emanuel Elyasaf in Rehovot, IL.

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9699835	Machine readable element and optical indicium for authenticating an item before processing	Itzhak Yogev, Ginat Rachel Muginstein, Rony Krysler	2017-07-04
7841529	Multiple optical head inspection system and a method for imaging an article	Avishay Guetta	2010-11-30	$5,930,000
7619203	High throughput multi beam detection system and method	Steven R. Rogers	2009-11-17	$14,573,000
7601944	High throughput multi beam detection system and method	Steven R. Rogers	2009-10-13	$11,309,000
7518718	High throughput inspection system and a method for generating transmitted and/or reflected images	Haim Feldman, Simon Yalov, Eitan Lahat	2009-04-14	$17,260,000
7504622	High throughput multi beam detection system and method	Nissim Elmaliah	2009-03-17	$10,205,000
7400390	Inspection system and a method for aerial reticle inspection	Alex Goldenshtein	2008-07-15	$16,085,000
7355690	Double inspection of reticle or wafer	Oren Boiman	2008-04-08	$17,034,000
7326901	High throughput multi beam system and method	Steven R. Rogers	2008-02-05	$34,685,000
7187439	High throughput inspection system and method for generating transmitted and/or reflected images	Haim Feldman, Simon Yalov, Eitan Lahat	2007-03-06	$17,668,000
7133548	Method and apparatus for reticle inspection using aerial imaging	Boaz Kenan, Yair Eran, Avner Karpol, Ehud Tirosh	2006-11-07	$19,896,000
7053395	Wafer defect detection system with traveling lens multi-beam scanner	Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn	2006-05-30	$15,443,000
6930770	High throughput inspection system and method for generating transmitted and/or reflected images	Haim Feldman, Simon Yalov, Eitan Lahat	2005-08-16	$29,641,000
6853475	Wafer defect detection system with traveling lens multi-beam scanner	Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn	2005-02-08	$20,730,000
6809808	Wafer defect detection system with traveling lens multi-beam scanner	Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn	2004-10-26	$27,881,000
6798505	Method and apparatus for article inspection including speckle reduction	Avner Karpol, Silviu Reinhorn, Shimon Yalov, Boaz Kenan	2004-09-28	$20,273,000
6268093	Method for reticle inspection using aerial imaging	Boaz Kenan, Yair Eran, Avner Karpol, Ehud Tirosh	2001-07-31	$84,886,000
6175645	Optical inspection method and apparatus	Ehud Tirosh	2001-01-16	$99,075,000
5892579	Optical inspection method and apparatus	Yair Eran	1999-04-06

Emanuel Elyasaf — 19 Patents

Issued Patents All Time

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