Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9699835 | Machine readable element and optical indicium for authenticating an item before processing | Itzhak Yogev, Ginat Rachel Muginstein, Rony Krysler | 2017-07-04 |
| 7841529 | Multiple optical head inspection system and a method for imaging an article | Avishay Guetta | 2010-11-30 |
| 7619203 | High throughput multi beam detection system and method | Steven R. Rogers | 2009-11-17 |
| 7601944 | High throughput multi beam detection system and method | Steven R. Rogers | 2009-10-13 |
| 7518718 | High throughput inspection system and a method for generating transmitted and/or reflected images | Haim Feldman, Simon Yalov, Eitan Lahat | 2009-04-14 |
| 7504622 | High throughput multi beam detection system and method | Nissim Elmaliah | 2009-03-17 |
| 7400390 | Inspection system and a method for aerial reticle inspection | Alex Goldenshtein | 2008-07-15 |
| 7355690 | Double inspection of reticle or wafer | Oren Boiman | 2008-04-08 |
| 7326901 | High throughput multi beam system and method | Steven R. Rogers | 2008-02-05 |
| 7187439 | High throughput inspection system and method for generating transmitted and/or reflected images | Haim Feldman, Simon Yalov, Eitan Lahat | 2007-03-06 |
| 7133548 | Method and apparatus for reticle inspection using aerial imaging | Boaz Kenan, Yair Eran, Avner Karpol, Ehud Tirosh | 2006-11-07 |
| 7053395 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2006-05-30 |
| 6930770 | High throughput inspection system and method for generating transmitted and/or reflected images | Haim Feldman, Simon Yalov, Eitan Lahat | 2005-08-16 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2005-02-08 |
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2004-10-26 |
| 6798505 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Shimon Yalov, Boaz Kenan | 2004-09-28 |
| 6268093 | Method for reticle inspection using aerial imaging | Boaz Kenan, Yair Eran, Avner Karpol, Ehud Tirosh | 2001-07-31 |
| 6175645 | Optical inspection method and apparatus | Ehud Tirosh | 2001-01-16 |
| 5892579 | Optical inspection method and apparatus | Yair Eran | 1999-04-06 |