Avner Karpol — 15 Patents at Applied Materials

Avner Karpol has been granted 15 US patents while listed as an inventor at Applied Materials. The first was granted in 1985 and the most recent in December 2008. Avner Karpol ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Avner Karpol in Nes Ziona, IL.

Patents per Year

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7463352	Method and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2008-12-09	$42,876,000
7133548	Method and apparatus for reticle inspection using aerial imaging	Boaz Kenan, Yair Eran, Emanuel Elyasaf, Ehud Tirosh	2006-11-07	$19,896,000
6924891	Method and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2005-08-02	$18,472,000
6798505	Method and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elyasaf, Shimon Yalov, Boaz Kenan	2004-09-28	$20,273,000
6735331	Method and apparatus for early detection and classification of retinal pathologies	Emanuel Binnun	2004-05-11
6587194	Method of and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2003-07-01	$40,730,000
6556294	Method of and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2003-04-29	$17,791,000
6466315	Method and system for reticle inspection by photolithography simulation	Boaz Kenan	2002-10-15	$18,888,000
6429931	Method and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2002-08-06	$31,580,000
6369888	Method and apparatus for article inspection including speckle reduction	Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov, Boaz Kenan	2002-04-09	$34,803,000
6267477	Three dimensional imaging apparatus and a method for use thereof	Ran Zeimer	2001-07-31
6268093	Method for reticle inspection using aerial imaging	Boaz Kenan, Yair Eran, Emanuel Elyasaf, Ehud Tirosh	2001-07-31	$84,886,000
5311111	Method of calibrating a step motor	Amnon Ganot	1994-05-10	$1,270,000
5140608	Optical system for focusing a light beam on to an image plane	Eviatar Halevi, Abraham Gross	1992-08-18	$1,187,000
4555727	Optical scanning apparatus	Emmanuel B. Nun, Rafi Izhar	1985-11-26	$209,000

Avner Karpol — 15 Patents

Patents per Year

Issued Patents All Time

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