BK

Boaz Kenan

Applied Materials: 14 patents #962 of 7,310Top 15%
SC Scitex: 2 patents #25 of 109Top 25%
Overall (All Time): #301,308 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7599075 Automatic optical inspection using multiple objectives Gilad Almogy, Bryan Bolt, Oded Arnon, Ehud Tirosh, Michael Corliss 2009-10-06
7463352 Method and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2008-12-09
7394531 Apparatus and method for automatic optical inspection Ehud Tirosh 2008-07-01
7355689 Automatic optical inspection using multiple objectives Gilad Almogy, Bryan Bolt, Oded Arnon, Ehud Tirosh, Michael Corliss 2008-04-08
7133548 Method and apparatus for reticle inspection using aerial imaging Yair Eran, Avner Karpol, Emanuel Elyasaf, Ehud Tirosh 2006-11-07
7072502 Alternating phase-shift mask inspection method and apparatus Shirley Hemar, Alex Goldenshtein, Gadi Greenberg, Mula Friedman 2006-07-04
6924891 Method and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2005-08-02
6798505 Method and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elyasaf, Shimon Yalov 2004-09-28
6587194 Method of and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2003-07-01
6556294 Method of and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2003-04-29
6466315 Method and system for reticle inspection by photolithography simulation Avner Karpol 2002-10-15
6429931 Method and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2002-08-06
6369888 Method and apparatus for article inspection including speckle reduction Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov 2002-04-09
6268093 Method for reticle inspection using aerial imaging Yair Eran, Avner Karpol, Emanuel Elyasaf, Ehud Tirosh 2001-07-31
5861904 Image-setter for multiple media exposure Yosef Kamir, Zvi Zagagi 1999-01-19
5594556 Scanner having a misalignment detector Eliyahu Vronsky 1997-01-14