Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7599075 | Automatic optical inspection using multiple objectives | Gilad Almogy, Bryan Bolt, Oded Arnon, Ehud Tirosh, Michael Corliss | 2009-10-06 |
| 7463352 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2008-12-09 |
| 7394531 | Apparatus and method for automatic optical inspection | Ehud Tirosh | 2008-07-01 |
| 7355689 | Automatic optical inspection using multiple objectives | Gilad Almogy, Bryan Bolt, Oded Arnon, Ehud Tirosh, Michael Corliss | 2008-04-08 |
| 7133548 | Method and apparatus for reticle inspection using aerial imaging | Yair Eran, Avner Karpol, Emanuel Elyasaf, Ehud Tirosh | 2006-11-07 |
| 7072502 | Alternating phase-shift mask inspection method and apparatus | Shirley Hemar, Alex Goldenshtein, Gadi Greenberg, Mula Friedman | 2006-07-04 |
| 6924891 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2005-08-02 |
| 6798505 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elyasaf, Shimon Yalov | 2004-09-28 |
| 6587194 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2003-07-01 |
| 6556294 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2003-04-29 |
| 6466315 | Method and system for reticle inspection by photolithography simulation | Avner Karpol | 2002-10-15 |
| 6429931 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2002-08-06 |
| 6369888 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Emanuel Elysaf, Shimon Yalov | 2002-04-09 |
| 6268093 | Method for reticle inspection using aerial imaging | Yair Eran, Avner Karpol, Emanuel Elyasaf, Ehud Tirosh | 2001-07-31 |
| 5861904 | Image-setter for multiple media exposure | Yosef Kamir, Zvi Zagagi | 1999-01-19 |
| 5594556 | Scanner having a misalignment detector | Eliyahu Vronsky | 1997-01-14 |