Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12078735 | Proximity-based navigation method | Zvi Lapidot | 2024-09-03 |
| 11812342 | Cellular-based navigation method | Zvi Lapidot | 2023-11-07 |
| 11347082 | Smartphone-assisted portable augmented reality (AR) device and clip-on unit for adjustable attachment to a user's spectacles | Zvi Lapidot, Oded Arnon, Uri Samet | 2022-05-31 |
| 10962778 | Apparatus and method for augmented reality | Zvi Lapidot, Oded Arnon | 2021-03-30 |
| 7846649 | High resolution printer and a method for high resolution printing | Gilad Almogy, Meir Aloni, Doron Meshulach | 2010-12-07 |
| 7842935 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more | 2010-11-30 |
| 7844103 | Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful therefor | — | 2010-11-30 |
| 7826049 | Inspection tools supporting multiple operating states for multiple detector arrangements | Dov Furman, Shai Silberstein | 2010-11-02 |
| 7796807 | Optical inspection apparatus for substrate defect detection | David Alumot, Gad Neumann, Rivka Sherman | 2010-09-14 |
| 7599075 | Automatic optical inspection using multiple objectives | Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss | 2009-10-06 |
| 7521700 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more | 2009-04-21 |
| 7518391 | Probe card and a method for detecting defects using a probe card and an additional inspection | Moshe Langer | 2009-04-14 |
| 7499583 | Optical inspection method for substrate defect detection | David Alumot, Gad Neumann, Rivka Sherman | 2009-03-03 |
| 7394531 | Apparatus and method for automatic optical inspection | Boaz Kenan | 2008-07-01 |
| 7355689 | Automatic optical inspection using multiple objectives | Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss | 2008-04-08 |
| 7133548 | Method and apparatus for reticle inspection using aerial imaging | Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf | 2006-11-07 |
| 7098468 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more | 2006-08-29 |
| 6952491 | Optical inspection apparatus for substrate defect detection | David Alumot, Gad Neumann, Rivka Sherman | 2005-10-04 |
| 6268093 | Method for reticle inspection using aerial imaging | Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf | 2001-07-31 |
| 6178257 | Substrate inspection method and apparatus | David Alumot, Gad Neumann, Rivka Sherman | 2001-01-23 |
| 6175645 | Optical inspection method and apparatus | Emanuel Elyasaf | 2001-01-16 |
| 5982921 | Optical inspection method and apparatus | David Alumot, Gad Neumann, Rivka Sherman | 1999-11-09 |
| 5731846 | Method and system for perspectively distoring an image and implanting same into a video stream | Haim Kreitman, Dan Bar-El, Yoel Amir | 1998-03-24 |
| 5699447 | Two-phase optical inspection method and apparatus for defect detection | David Alumot, Gad Neumann, Rivka Sherman | 1997-12-16 |
| 5491517 | System for implanting an image into a video stream | Haim Kreitman, Dan Bar-El, Yoel Amir | 1996-02-13 |