Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Ehud Tirosh — 25 Patents

Applied Materials: 18 patents #747 of 7,310Top 15%
OIOrbot Instruments: 1 patents #9 of 15Top 60%
Nes Ziona, IL: #43 of 4,774 inventorsTop 1%
Overall (All Time): #158,593 of 4,157,543Top 4%
25 Patents All Time
Ehud Tirosh has been granted 25 US patents while listed as an inventor at Applied Materials. The first was granted in 1996 and the most recent in September 2024. Ehud Tirosh ranks #158,593 of 4,157,543 US inventors in our database (top 3.8%). Patent records list Ehud Tirosh in Nes Ziona, IL.

Patents per Year

Patents granted per year, 1996 to 2024Bar chart with a peak of 5 patents in 2010.peak 51996: 1 patents19961997: 1 patents1998: 1 patents19981999: 1 patents2001: 3 patents20012005: 1 patents2006: 2 patents20062008: 2 patents2009: 4 patents20092010: 5 patents2021: 1 patents20212022: 1 patents2023: 1 patents20232024: 1 patents2024

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12078735 Proximity-based navigation method Zvi Lapidot 2024-09-03
11812342 Cellular-based navigation method Zvi Lapidot 2023-11-07
11347082 Smartphone-assisted portable augmented reality (AR) device and clip-on unit for adjustable attachment to a user's spectacles Zvi Lapidot, Oded Arnon, Uri Samet 2022-05-31
10962778 Apparatus and method for augmented reality Zvi Lapidot, Oded Arnon 2021-03-30
7846649 High resolution printer and a method for high resolution printing Gilad Almogy, Meir Aloni, Doron Meshulach 2010-12-07 $3,240,000
7842935 Raster frame beam system for electron beam lithography Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more 2010-11-30 $5,930,000
7844103 Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful therefor 2010-11-30 $5,930,000
7826049 Inspection tools supporting multiple operating states for multiple detector arrangements Dov Furman, Shai Silberstein 2010-11-02
7796807 Optical inspection apparatus for substrate defect detection David Alumot, Gad Neumann, Rivka Sherman 2010-09-14 $9,681,000
7599075 Automatic optical inspection using multiple objectives Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss 2009-10-06 $23,969,000
7521700 Raster frame beam system for electron beam lithography Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more 2009-04-21 $9,285,000
7518391 Probe card and a method for detecting defects using a probe card and an additional inspection Moshe Langer 2009-04-14 $17,260,000
7499583 Optical inspection method for substrate defect detection David Alumot, Gad Neumann, Rivka Sherman 2009-03-03 $11,197,000
7394531 Apparatus and method for automatic optical inspection Boaz Kenan 2008-07-01 $29,858,000
7355689 Automatic optical inspection using multiple objectives Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss 2008-04-08 $17,034,000
7133548 Method and apparatus for reticle inspection using aerial imaging Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf 2006-11-07 $19,896,000
7098468 Raster frame beam system for electron beam lithography Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more 2006-08-29 $18,591,000
6952491 Optical inspection apparatus for substrate defect detection David Alumot, Gad Neumann, Rivka Sherman 2005-10-04 $22,278,000
6268093 Method for reticle inspection using aerial imaging Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf 2001-07-31 $84,886,000
6178257 Substrate inspection method and apparatus David Alumot, Gad Neumann, Rivka Sherman 2001-01-23 $87,341,000
6175645 Optical inspection method and apparatus Emanuel Elyasaf 2001-01-16 $99,075,000
5982921 Optical inspection method and apparatus David Alumot, Gad Neumann, Rivka Sherman 1999-11-09 $71,221,000
5731846 Method and system for perspectively distoring an image and implanting same into a video stream Haim Kreitman, Dan Bar-El, Yoel Amir 1998-03-24
5699447 Two-phase optical inspection method and apparatus for defect detection David Alumot, Gad Neumann, Rivka Sherman 1997-12-16
5491517 System for implanting an image into a video stream Haim Kreitman, Dan Bar-El, Yoel Amir 1996-02-13