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Proximity-based navigation method |
Zvi Lapidot |
2024-09-03 |
| 11812342 |
Cellular-based navigation method |
Zvi Lapidot |
2023-11-07 |
| 11347082 |
Smartphone-assisted portable augmented reality (AR) device and clip-on unit for adjustable attachment to a user's spectacles |
Zvi Lapidot, Oded Arnon, Uri Samet |
2022-05-31 |
| 10962778 |
Apparatus and method for augmented reality |
Zvi Lapidot, Oded Arnon |
2021-03-30 |
| 7846649 |
High resolution printer and a method for high resolution printing |
Gilad Almogy, Meir Aloni, Doron Meshulach |
2010-12-07 |
| 7842935 |
Raster frame beam system for electron beam lithography |
Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more |
2010-11-30 |
| 7844103 |
Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful therefor |
— |
2010-11-30 |
| 7826049 |
Inspection tools supporting multiple operating states for multiple detector arrangements |
Dov Furman, Shai Silberstein |
2010-11-02 |
| 7796807 |
Optical inspection apparatus for substrate defect detection |
David Alumot, Gad Neumann, Rivka Sherman |
2010-09-14 |
| 7599075 |
Automatic optical inspection using multiple objectives |
Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss |
2009-10-06 |
| 7521700 |
Raster frame beam system for electron beam lithography |
Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more |
2009-04-21 |
| 7518391 |
Probe card and a method for detecting defects using a probe card and an additional inspection |
Moshe Langer |
2009-04-14 |
| 7499583 |
Optical inspection method for substrate defect detection |
David Alumot, Gad Neumann, Rivka Sherman |
2009-03-03 |
| 7394531 |
Apparatus and method for automatic optical inspection |
Boaz Kenan |
2008-07-01 |
| 7355689 |
Automatic optical inspection using multiple objectives |
Gilad Almogy, Bryan Bolt, Oded Arnon, Boaz Kenan, Michael Corliss |
2008-04-08 |
| 7133548 |
Method and apparatus for reticle inspection using aerial imaging |
Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf |
2006-11-07 |
| 7098468 |
Raster frame beam system for electron beam lithography |
Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman +2 more |
2006-08-29 |
| 6952491 |
Optical inspection apparatus for substrate defect detection |
David Alumot, Gad Neumann, Rivka Sherman |
2005-10-04 |
| 6268093 |
Method for reticle inspection using aerial imaging |
Boaz Kenan, Yair Eran, Avner Karpol, Emanuel Elyasaf |
2001-07-31 |
| 6178257 |
Substrate inspection method and apparatus |
David Alumot, Gad Neumann, Rivka Sherman |
2001-01-23 |
| 6175645 |
Optical inspection method and apparatus |
Emanuel Elyasaf |
2001-01-16 |
| 5982921 |
Optical inspection method and apparatus |
David Alumot, Gad Neumann, Rivka Sherman |
1999-11-09 |
| 5731846 |
Method and system for perspectively distoring an image and implanting same into a video stream |
Haim Kreitman, Dan Bar-El, Yoel Amir |
1998-03-24 |
| 5699447 |
Two-phase optical inspection method and apparatus for defect detection |
David Alumot, Gad Neumann, Rivka Sherman |
1997-12-16 |
| 5491517 |
System for implanting an image into a video stream |
Haim Kreitman, Dan Bar-El, Yoel Amir |
1996-02-13 |
