Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7796807 | Optical inspection apparatus for substrate defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 2010-09-14 |
| 7499583 | Optical inspection method for substrate defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 2009-03-03 |
| 6952491 | Optical inspection apparatus for substrate defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 2005-10-04 |
| 6178257 | Substrate inspection method and apparatus | David Alumot, Gad Neumann, Ehud Tirosh | 2001-01-23 |
| 5982921 | Optical inspection method and apparatus | David Alumot, Gad Neumann, Ehud Tirosh | 1999-11-09 |
| 5699447 | Two-phase optical inspection method and apparatus for defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 1997-12-16 |