Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7961763 | System for detection of wafer defects | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2011-06-14 |
| 7843559 | System for detection of wafer defects | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2010-11-30 |
| 7796807 | Optical inspection apparatus for substrate defect detection | David Alumot, Rivka Sherman, Ehud Tirosh | 2010-09-14 |
| 7633041 | Apparatus for determining optimum position of focus of an imaging system | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2009-12-15 |
| 7525659 | System for detection of water defects | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2009-04-28 |
| 7499583 | Optical inspection method for substrate defect detection | David Alumot, Rivka Sherman, Ehud Tirosh | 2009-03-03 |
| 7477383 | System for detection of wafer defects | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2009-01-13 |
| 7260298 | Fiber optical illumination system | Dov Furman, Noam Dotan | 2007-08-21 |
| 7180586 | System for detection of wafer defects | Noam Dotan | 2007-02-20 |
| 6952491 | Optical inspection apparatus for substrate defect detection | David Alumot, Rivka Sherman, Ehud Tirosh | 2005-10-04 |
| 6892013 | Fiber optical illumination system | Dov Furman, Noam Dotan | 2005-05-10 |
| 6693664 | Method and system for fast on-line electro-optical detection of wafer defects | — | 2004-02-17 |
| 6178257 | Substrate inspection method and apparatus | David Alumot, Rivka Sherman, Ehud Tirosh | 2001-01-23 |
| 5982921 | Optical inspection method and apparatus | David Alumot, Rivka Sherman, Ehud Tirosh | 1999-11-09 |
| 5699447 | Two-phase optical inspection method and apparatus for defect detection | David Alumot, Rivka Sherman, Ehud Tirosh | 1997-12-16 |