RS

Ram Segal

Applied Materials: 3 patents #2,994 of 7,310Top 45%
NE Negevtech: 2 patents #4 of 9Top 45%
Apple: 1 patents #12,251 of 18,612Top 70%
Overall (All Time): #688,910 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12430749 Cell-to-cell comparison method Tae Hoon Park, Junhee Jeong, Ehud Gabai, Ella Mendelson, Eyal Shamur 2025-09-30
9229690 Automatic computer code parallelization Efraim Shoham, Gil Meir, Evgeny Maximov 2016-01-05
7961763 System for detection of wafer defects Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Shai Silberstein 2011-06-14
7843559 System for detection of wafer defects Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Shai Silberstein 2010-11-30
7633041 Apparatus for determining optimum position of focus of an imaging system Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Shai Silberstein 2009-12-15
7525659 System for detection of water defects Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Shai Silberstein 2009-04-28
7477383 System for detection of wafer defects Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Shai Silberstein 2009-01-13