Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12376608 | Meat analogues and methods of producing the same | Eshchar Ben-Shitrit, Alexey Tomsov, Daniel Mandelik, Daniel Dikovsky | 2025-08-05 |
| 12229926 | Method and system for deblurring a blurred image | Tzvi Philipp, Dan Levi | 2025-02-18 |
| 12214601 | Detecting a defective nozzle in a digital printing system | Boris Levant, Tomer Yanir, Avraham Guttman, Alon Siman Tov | 2025-02-04 |
| 12187027 | Quality control in a digital printing system | Avraham Guttman, Yoav Gross | 2025-01-07 |
| 10046715 | Systems and methods for object detection | Dan Levi | 2018-08-14 |
| 8681226 | Photography-task-specific digital camera apparatus and methods useful in conjunction therewith | — | 2014-03-25 |
| 8169484 | Photography-specific digital camera apparatus and methods useful in conjunction therewith | — | 2012-05-01 |
| 8135207 | Optical inspection tools featuring parallel post-inspection analysis | Tsafrir Avni | 2012-03-13 |
| 8098372 | Optical inspection tool featuring multiple speed modes | Giora Eitan | 2012-01-17 |
| 8031931 | Printed fourier filtering in optical inspection tools | Dan Fuchs | 2011-10-04 |
| 7973921 | Dynamic illumination in optical inspection systems | Tsafrir Avni | 2011-07-05 |
| 7961763 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2011-06-14 |
| 7924420 | Optical inspection including partial scanning of wafers | Gilad Shomrony, Arnon Gratch | 2011-04-12 |
| 7843559 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2010-11-30 |
| 7826049 | Inspection tools supporting multiple operating states for multiple detector arrangements | Dov Furman, Ehud Tirosh | 2010-11-02 |
| 7804993 | Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images | Yuval Dorphan, Ran Zaslavsky, Mark Wagner, Dov Furman | 2010-09-28 |
| 7719674 | Image splitting in optical inspection systems | Dov Furman, Effy Miklatzky, Daniel Mandelik, Martin Abraham | 2010-05-18 |
| 7714998 | Image splitting in optical inspection systems | Dov Furman, Roy Kaner, Ori Gonen, Daniel Mandelik, Eran Tal | 2010-05-11 |
| 7659973 | Wafer inspection using short-pulsed continuous broadband illumination | Dov Furman | 2010-02-09 |
| 7633041 | Apparatus for determining optimum position of focus of an imaging system | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2009-12-15 |
| 7525659 | System for detection of water defects | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2009-04-28 |
| 7477383 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2009-01-13 |