Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11692537 | Method and system for damping flow pulsation | Justus Hoffstaedt, Ryan Melville Whillier Brand, Elad Orian | 2023-07-04 |
| 11289973 | Borehole pump and method of using the same | Elad Orian, Ryan Melville Whillier Brand | 2022-03-29 |
| 10753355 | Borehole pump and method of using the same | Elad Orian, Ryan Melville Whillier Brand | 2020-08-25 |
| 7961763 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Ram Segal, Shai Silberstein | 2011-06-14 |
| 7843559 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Ram Segal, Shai Silberstein | 2010-11-30 |
| 7813541 | Method and apparatus for detecting defects in wafers | Erez Sali, Tomer Yanir, Mark Wagner, Yuval Dorfan, Ran Zaslavsky | 2010-10-12 |
| 7804590 | Multi mode inspection method and apparatus | Dov Furman, Efraim Miklatzky | 2010-09-28 |
| 7633041 | Apparatus for determining optimum position of focus of an imaging system | Dov Furman, Gad Neumann, Mark Wagner, Ram Segal, Shai Silberstein | 2009-12-15 |
| 7525659 | System for detection of water defects | Dov Furman, Gad Neumann, Mark Wagner, Ram Segal, Shai Silberstein | 2009-04-28 |
| 7480039 | Multi mode inspection method and apparatus | Dov Furman, Efraim Miklatzky | 2009-01-20 |
| 7477383 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Ram Segal, Shai Silberstein | 2009-01-13 |
| 7274444 | Multi mode inspection method and apparatus | Dov Furman, Efraim Miklatzky | 2007-09-25 |
| 7260298 | Fiber optical illumination system | Dov Furman, Gad Neumann | 2007-08-21 |
| 7180586 | System for detection of wafer defects | Gad Neumann | 2007-02-20 |
| 6892013 | Fiber optical illumination system | Dov Furman, Gad Neumann | 2005-05-10 |
| 6627886 | Secondary electron spectroscopy method and system | Dov Shachal | 2003-09-30 |
| 6521891 | Focusing method and system | Asher Pearl | 2003-02-18 |
| 6407373 | Apparatus and method for reviewing defects on an object | — | 2002-06-18 |
| 6407386 | System and method for automatic analysis of defect material on semiconductors | Alexander Kadyshevitch | 2002-06-18 |
| 6353222 | Determining defect depth and contour information in wafer structures using multiple SEM images | — | 2002-03-05 |
| 6215895 | Apparatus and method for display panel inspection | Erez Sali, Yigal Katzir, Abraham Gross | 2001-04-10 |
| 6201240 | SEM image enhancement using narrow band detection and color assignment | Sergio Serulnik, Dubi Shachal | 2001-03-13 |
| 6194718 | Method for reducing aliasing effects in scanning beam microscopy | — | 2001-02-27 |
| 5771068 | Apparatus and method for display panel inspection | Erez Sali, Yigal Katzir, Abraham Gross | 1998-06-23 |
| 5659172 | Reliable defect detection using multiple perspective scanning electron microscope images | Mark Wagner | 1997-08-19 |