Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7813541 | Method and apparatus for detecting defects in wafers | Erez Sali, Tomer Yanir, Mark Wagner, Noam Dotan, Ran Zaslavsky | 2010-10-12 |
YD
Yuval Dorfan
Overall (All Time): #3,305,783 of 4,157,543Top 80%
1
Patents All Time