ES

Erez Sali

Apple: 9 patents #3,465 of 18,612Top 20%
IM Imageid: 7 patents #1 of 5Top 20%
Applied Materials: 3 patents #2,994 of 7,310Top 45%
PR Primesense: 3 patents #10 of 48Top 25%
OR Orbotech: 2 patents #49 of 175Top 30%
NE Negevtech: 1 patents #8 of 9Top 90%
Overall (All Time): #163,028 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11100661 Multi-modal depth mapping Alexander Shpunt, Gerard Guy Medioni, Daniel Cohen, Ronen Deitch 2021-08-24
10636155 Multi-modal depth mapping Alexander Shpunt, Gerard Guy Medioni, Daniel Cohen, Ronen Deitch 2020-04-28
10152801 Depth mapping based on pattern matching and stereoscopic information Alexander Shpunt, Gerard Guy Medioni, Daniel Cohen, Ronen Deitch 2018-12-11
9871980 Multi-zone imaging sensor and lens array Benny Pesach, Alexander Shpunt 2018-01-16
9582889 Depth mapping based on pattern matching and stereoscopic information Alexander Shpunt, Gerard Guy Medioni, Daniel Cohen, Ronen Deitch 2017-02-28
9350973 Three-dimensional mapping and imaging Assaf Avraham 2016-05-24
9330324 Error compensation in three-dimensional mapping Daniel Cohen, Dmitri Rais, Niv Galezer, Alexander Shpunt 2016-05-03
9030528 Multi-zone imaging sensor and lens array Benny Pesach, Alexander Shpunt 2015-05-12
8959013 Virtual keyboard for a non-tactile three dimensional user interface Micha Galor, Ofir Or, Shai Litvak 2015-02-17
8830227 Depth-based gain control Dmitry Rais, Daniel Cohen 2014-09-09
8717417 Three-dimensional mapping and imaging Assaf Avraham 2014-05-06
8565479 Extraction of skeletons from 3D maps Amiad Gurman, Tomer Yanir 2013-10-22
7916286 Defect detection through image comparison using relative measures Oren Cohen 2011-03-29
7869643 Advanced cell-to-cell inspection Zeev Litichever, Oren Cohen 2011-01-11
7813541 Method and apparatus for detecting defects in wafers Tomer Yanir, Mark Wagner, Noam Dotan, Yuval Dorfan, Ran Zaslavsky 2010-10-12
7474333 Method for automatic identification and data capture Moti Shniberg, Yaron Nemet 2009-01-06
7369236 Defect detection through image comparison using relative measures Oren Cohen 2008-05-06
7262792 System and methodology for tracking objects using visually sensible indicators Moti Shniberg, Yaron Nemet 2007-08-28
7210631 Color bar code system Doniel M. Lax 2007-05-01
7051935 Color calibration for color bar codes Doniel M. Lax 2006-05-30
6922208 Method for automatic identification and data capture Moti Shniberg, Yaron Nemet 2005-07-26
6902113 Selection of colors for color bar codes Michael Keselbrener 2005-06-07
6801245 Method for automatic identification and data capture Moti Shniberg, Yaron Nemet 2004-10-05
6215895 Apparatus and method for display panel inspection Yigal Katzir, Noam Dotan, Abraham Gross 2001-04-10
5771068 Apparatus and method for display panel inspection Yigal Katzir, Noam Dotan, Abraham Gross 1998-06-23