Mark Wagner — 14 Patents at National Optronics

Mark Wagner has been granted 14 US patents while listed as an inventor at National Optronics. The first was granted in 1987 and the most recent in June 2011. Mark Wagner ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Mark Wagner in Morristown, NJ, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date
7961763	System for detection of wafer defects	Dov Furman, Gad Neumann, Noam Dotan, Ram Segal, Shai Silberstein	2011-06-14
7843559	System for detection of wafer defects	Dov Furman, Gad Neumann, Noam Dotan, Ram Segal, Shai Silberstein	2010-11-30
7813541	Method and apparatus for detecting defects in wafers	Erez Sali, Tomer Yanir, Noam Dotan, Yuval Dorfan, Ran Zaslavsky	2010-10-12
7804993	Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images	Yuval Dorphan, Ran Zaslavsky, Dov Furman, Shai Silberstein	2010-09-28
7633041	Apparatus for determining optimum position of focus of an imaging system	Dov Furman, Gad Neumann, Noam Dotan, Ram Segal, Shai Silberstein	2009-12-15
7525659	System for detection of water defects	Dov Furman, Gad Neumann, Noam Dotan, Ram Segal, Shai Silberstein	2009-04-28
7477383	System for detection of wafer defects	Dov Furman, Gad Neumann, Noam Dotan, Ram Segal, Shai Silberstein	2009-01-13
7369238	Lens blank alignment and blocking device and method	Daniel E. Andrews, David Gerding, Henrik Arthur Schutz, Jennifer Snyder Shanks, David M. Smith +1 more	2008-05-06
7193714	Lens blank alignment and blocking device and method	Daniel E. Andrews, David Gerding, Henrik Arthur Schutz, Jennifer Snyder Shanks, David M. Smith +1 more	2007-03-20
6869333	Lens blank alignment and blocking device and method	Daniel E. Andrews, David Gerding, Henrik Arthur Schutz, Jennifer Snyder Shanks, David M. Smith +1 more	2005-03-22
D489825	Lens blocker	Daniel E. Andrews, David Gerding, Henrik Arthur Schutz, Jennifer Snyder Shanks, David M. Smith	2004-05-11
5659172	Reliable defect detection using multiple perspective scanning electron microscope images	Noam Dotan	1997-08-19
5158422	Method and apparatus for shaping and finishing lenses	—	1992-10-27
4712429	Windscreen and two microphone configuration for blast noise detection	Richard Raspet	1987-12-15

Mark Wagner — 14 Patents

Issued Patents All Time

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