Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7800062 | Method and system for the examination of specimen | Alex Goldenshtein, Radel Ben-Av, Igor Petrov, Nadav Haas, Pavel Adamec +1 more | 2010-09-21 |
| 7427753 | Method of cross-section milling with focused ion beam (FIB) device | — | 2008-09-23 |
| 7385205 | Method and device for aligning a charged particle beam column | — | 2008-06-10 |
| 7335893 | Method and device for aligning a charged particle beam column | — | 2008-02-26 |
| 7105843 | Method and system for controlling focused ion beam alignment with a sample | — | 2006-09-12 |
| 6914386 | Source of liquid metal ions and a method for controlling the source | — | 2005-07-05 |
| 6545275 | Beam evaluation | Nadav Haas, Yacov Elgar | 2003-04-08 |
| 6521891 | Focusing method and system | Noam Dotan | 2003-02-18 |