Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card and a method for detecting defects using a probe card and an additional inspection

Probe card and a method for detecting defects using a probe card and an additional inspection

US Patent 7518391 · Granted Apr 14, 2009

Estimated economic value: $17,260,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for performing active distance measurements2025
Proximity-based navigation method2024
Cellular-based navigation method2023
System and method for performing active distance measurements2023
Smartphone-assisted portable augmented reality (AR) device and clip-on unit for 2022
Managing a change in a physical property of a vehicle due to an external object2022
Apparatus and method for augmented reality2021
High electron energy based overlay error measurement methods and systems2015
Method and system for notifying an addressee of a communication session2014
High resolution wafer inspection system2011
High resolution printer and a method for high resolution printing2010
Raster frame beam system for electron beam lithography2010