| 10591406 |
Symmetric target design in scatterometry overlay metrology |
Barak Bringoltz, Daniel Kandel, Yoel Feler, Noam Sapiens, Paykin Irina +4 more |
2020-03-17 |
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| 9739702 |
Symmetric target design in scatterometry overlay metrology |
Barak Bringoltz, Daniel Kandel, Yoel Feler, Noam Sapiens, Irina Paykin +4 more |
2017-08-22 |
|
| 9581430 |
Phase characterization of targets |
Amnon Manassen, Ohad Bachar, Daria Negri, Boris Golovanevsky, Barak Bringoltz +8 more |
2017-02-28 |
|
| 7846649 |
High resolution printer and a method for high resolution printing |
Ehud Tirosh, Gilad Almogy, Doron Meshulach |
2010-12-07 |
$3,240,000 |
| 7842935 |
Raster frame beam system for electron beam lithography |
Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more |
2010-11-30 |
$5,930,000 |
| 7521700 |
Raster frame beam system for electron beam lithography |
Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more |
2009-04-21 |
$9,285,000 |
| 7379161 |
Printer and a method for recording a multi-level image |
Gilad Almogy, Haim Feldman |
2008-05-27 |
$25,876,000 |
| 7098468 |
Raster frame beam system for electron beam lithography |
Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatah Lehman +2 more |
2006-08-29 |
$18,591,000 |
| 7053985 |
Printer and a method for recording a multi-level image |
Gilad Almogy, Haim Feldman |
2006-05-30 |
$15,443,000 |
| 6481856 |
Light sampling devices and projector system including same |
Yitzhak Weissman, Yair Dankner |
2002-11-19 |
|
| 6366687 |
Data converter apparatus and method particularly useful for a database-to-object inspection system |
Nissim Elmaliach, Mula Friedman, Yonatan Lehman |
2002-04-02 |
$41,044,000 |
| 6360005 |
Apparatus and method for microscopic inspection of articles |
Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld |
2002-03-19 |
$47,426,000 |
| 6219011 |
Electro-optical display apparatus |
Amir Rosenthal, Avinoam Livni, Nissim Elmaliah |
2001-04-17 |
|
| 5907628 |
Apparatus and method for comparing and aligning two digital representations of an image |
Joel Yolles, Yair Eran, Haim Kaplan |
1999-05-25 |
|
| 5619429 |
Apparatus and method for inspection of a patterned object by comparison thereof to a reference |
Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld |
1997-04-08 |
|
| 5619588 |
Apparatus and method for comparing and aligning two digital representations of an image |
Joel Yolles, Yair Eran, Haim Kaplan |
1997-04-08 |
|
| 5586058 |
Apparatus and method for inspection of a patterned object by comparison thereof to a reference |
Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld |
1996-12-17 |
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