Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10591406 | Symmetric target design in scatterometry overlay metrology | Barak Bringoltz, Daniel Kandel, Yoel Feler, Noam Sapiens, Paykin Irina +4 more | 2020-03-17 |
| 9739702 | Symmetric target design in scatterometry overlay metrology | Barak Bringoltz, Daniel Kandel, Yoel Feler, Noam Sapiens, Irina Paykin +4 more | 2017-08-22 |
| 9581430 | Phase characterization of targets | Amnon Manassen, Ohad Bachar, Daria Negri, Boris Golovanevsky, Barak Bringoltz +8 more | 2017-02-28 |
| 7846649 | High resolution printer and a method for high resolution printing | Ehud Tirosh, Gilad Almogy, Doron Meshulach | 2010-12-07 |
| 7842935 | Raster frame beam system for electron beam lithography | Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2010-11-30 |
| 7521700 | Raster frame beam system for electron beam lithography | Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2009-04-21 |
| 7379161 | Printer and a method for recording a multi-level image | Gilad Almogy, Haim Feldman | 2008-05-27 |
| 7098468 | Raster frame beam system for electron beam lithography | Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatah Lehman +2 more | 2006-08-29 |
| 7053985 | Printer and a method for recording a multi-level image | Gilad Almogy, Haim Feldman | 2006-05-30 |
| 6481856 | Light sampling devices and projector system including same | Yitzhak Weissman, Yair Dankner | 2002-11-19 |
| 6366687 | Data converter apparatus and method particularly useful for a database-to-object inspection system | Nissim Elmaliach, Mula Friedman, Yonatan Lehman | 2002-04-02 |
| 6360005 | Apparatus and method for microscopic inspection of articles | Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld | 2002-03-19 |
| 6219011 | Electro-optical display apparatus | Amir Rosenthal, Avinoam Livni, Nissim Elmaliah | 2001-04-17 |
| 5907628 | Apparatus and method for comparing and aligning two digital representations of an image | Joel Yolles, Yair Eran, Haim Kaplan | 1999-05-25 |
| 5619429 | Apparatus and method for inspection of a patterned object by comparison thereof to a reference | Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld | 1997-04-08 |
| 5619588 | Apparatus and method for comparing and aligning two digital representations of an image | Joel Yolles, Yair Eran, Haim Kaplan | 1997-04-08 |
| 5586058 | Apparatus and method for inspection of a patterned object by comparison thereof to a reference | Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld | 1996-12-17 |