Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8207504 | Inspection of EUV masks by a DUV mask inspection tool | Chaim Braude, Mariano Abramson, Adam Baer, Yuri Belenky | 2012-06-26 |
| 7842935 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2010-11-30 |
| 7595490 | Charged particle beam emitting device and method for operating a charged particle beam emitting device | Fang Zhou, Pavel Adamec, Jürgen Frosien | 2009-09-29 |
| 7521700 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2009-04-21 |
| 7164142 | Electrical feed-through structure and method | Efim Vinnitsky, Eliyahu Almog | 2007-01-16 |
| 7098468 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Gilad Almogy, Alon Litman, Yonatah Lehman +2 more | 2006-08-29 |
| 6932873 | Managing work-piece deflection | Betsalel Rechav, Efim Vinnitsky | 2005-08-23 |
| 6894435 | Method and device for rastering source redundancy | David Aviel, Radel Ben-Av | 2005-05-17 |