Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7842935 | Raster frame beam system for electron beam lithography | Meir Aloni, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2010-11-30 |
| 7521700 | Raster frame beam system for electron beam lithography | Meir Aloni, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman +2 more | 2009-04-21 |
| 7098468 | Raster frame beam system for electron beam lithography | Meir Aloni, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatah Lehman +2 more | 2006-08-29 |
| 7072502 | Alternating phase-shift mask inspection method and apparatus | Shirley Hemar, Alex Goldenshtein, Gadi Greenberg, Boaz Kenan | 2006-07-04 |
| 6366687 | Data converter apparatus and method particularly useful for a database-to-object inspection system | Meir Aloni, Nissim Elmaliach, Yonatan Lehman | 2002-04-02 |