NE

Nissim Elmaliach

Applied Materials: 7 patents #1,721 of 7,310Top 25%
CG Carl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
Overall (All Time): #732,517 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
9702983 Multi-spot collection optics Haim Eder, Igor Krayvitz (Krivts), Mario Mützel 2017-07-11
7468506 Spot grid array scanning system Steven R. Rogers, Emanuel Elyasef, Alon Litman, Ron Naftali 2008-12-23
7468507 Optical spot grid array scanning system Steven R. Rogers, Emanuel Elyasef, Alon Litman, Ron Naftali, Doron Meshulach 2008-12-23
7053395 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2006-05-30
6853475 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2005-02-08
6809808 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2004-10-26
6366687 Data converter apparatus and method particularly useful for a database-to-object inspection system Meir Aloni, Mula Friedman, Yonatan Lehman 2002-04-02