Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Nissim Elmaliach — 7 Patents

Applied Materials: 7 patents #1,734 of 7,310Top 25%
CGCarl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
Raanana, IL: #161 of 1,034 inventorsTop 20%
Overall (All Time): #680,018 of 4,157,543Top 20%
7 Patents All Time
Nissim Elmaliach has been granted 7 US patents while listed as an inventor at Applied Materials. The first was granted in 2002 and the most recent in July 2017. Nissim Elmaliach ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Nissim Elmaliach in Raanana, IL.

Patents per Year

Patents granted per year, 2002 to 2017Bar chart with a peak of 2 patents in 2008.peak 22002: 1 patents20022004: 1 patents20042005: 1 patents20052006: 1 patents20062008: 2 patents20082017: 1 patents2017

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9702983 Multi-spot collection optics Haim Eder, Igor Krayvitz (Krivts), Mario Mützel 2017-07-11 $41,590,000
7468506 Spot grid array scanning system Steven R. Rogers, Emanuel Elyasef, Alon Litman, Ron Naftali 2008-12-23 $29,995,000
7468507 Optical spot grid array scanning system Steven R. Rogers, Emanuel Elyasef, Alon Litman, Ron Naftali, Doron Meshulach 2008-12-23 $29,995,000
7053395 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2006-05-30 $15,443,000
6853475 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2005-02-08 $20,730,000
6809808 Wafer defect detection system with traveling lens multi-beam scanner Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn 2004-10-26 $27,881,000
6366687 Data converter apparatus and method particularly useful for a database-to-object inspection system Meir Aloni, Mula Friedman, Yonatan Lehman 2002-04-02 $41,044,000