Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7460221 | Method and system for detecting defects | Boris Goldberg | 2008-12-02 |
| 7428850 | Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system | Yoram Uziel, Ran Vered, Eitan Pinhasi, Igor Krivts (Krayvitz) | 2008-09-30 |
| 7268343 | Method and system for detecting defects | Boris Goldberg | 2007-09-11 |
| 7184612 | Hardware configuration for parallel data processing without cross communication | Vitaly Rubinovich | 2007-02-27 |
| 7173694 | Method and system for detecting defects | Boris Goldberg | 2007-02-06 |
| 7109463 | Amplifier circuit with a switching device to provide a wide dynamic output range | Erel Milshtein | 2006-09-19 |
| 7053395 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Boris Golberg, Silviu Reinhorn | 2006-05-30 |
| 7053999 | Method and system for detecting defects | Boris Goldberg | 2006-05-30 |
| 7030978 | System and method for inspection of a substrate that has a refractive index | Avishay Guetta, Haim Feldman, Doron Shoham | 2006-04-18 |
| 6914670 | Defect detection with enhanced dynamic range | Gilad Almogy, Boris Goldberg | 2005-07-05 |
| 6898304 | Hardware configuration for parallel data processing without cross communication | Vitaly Rubinovich | 2005-05-24 |
| 6882417 | Method and system for detecting defects | Boris Goldberg | 2005-04-19 |
| 6861660 | Process and assembly for non-destructive surface inspection | Gilad Almogy, Avishay Guetta, Doron Shoham | 2005-03-01 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Boris Golberg, Silviu Reinhorn | 2005-02-08 |
| 6831736 | Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning | Rami Elichai, Gilad Schwartz, Pavel Margulis, Igor Slobodnik | 2004-12-14 |
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Boris Golberg, Silviu Reinhorn | 2004-10-26 |
| 6657714 | Defect detection with enhanced dynamic range | Gilad Almogy, Boris Goldberg | 2003-12-02 |
| 6469784 | Optical inspection method and apparatus utilizing a variable angle design | Boris Golberg, Amir Komem, Gilad Almogy | 2002-10-22 |
| 6366352 | Optical inspection method and apparatus utilizing a variable angle design | Boris Goldberg, Amir Komem, Gilad Almogy | 2002-04-02 |
| 6124924 | Focus error correction method and apparatus | Haim Feldman, Gilad Almogy, Amir Komeem | 2000-09-26 |