HF

Haim Feldman

Applied Materials: 45 patents #188 of 7,310Top 3%
TL Technion Research & Development Foundation Limited: 1 patents #488 of 1,205Top 45%
Overall (All Time): #67,766 of 4,157,543Top 2%
44
Patents All Time

Issued Patents All Time

Showing 26–44 of 44 patents

Patent #TitleCo-InventorsDate
7379161 Printer and a method for recording a multi-level image Gilad Almogy, Meir Aloni 2008-05-27
7342218 Methods and systems for optical inspection of surfaces based on laser screening Gilad Almogy 2008-03-11
7339661 Dark field inspection system Doron Korngut, Erez Admoni, Ofer Kadar, Lev Haikoviz, Avishay Guetta 2008-03-04
7331033 Simulation of aerial images 2008-02-12
7286239 Laser scanner with amplitude and phase detection 2007-10-23
7187439 High throughput inspection system and method for generating transmitted and/or reflected images Emanuel Elyasaf, Simon Yalov, Eitan Lahat 2007-03-06
7053395 Wafer defect detection system with traveling lens multi-beam scanner Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn 2006-05-30
7053985 Printer and a method for recording a multi-level image Gilad Almogy, Meir Aloni 2006-05-30
7030978 System and method for inspection of a substrate that has a refractive index Avishay Guetta, Ron Naftali, Doron Shoham 2006-04-18
7002695 Dual-spot phase-sensitive detection 2006-02-21
6943898 Apparatus and method for dual spot inspection of repetitive patterns Alexander Libinson, Daniel I. Some, Boris Goldberg 2005-09-13
6937343 Laser scanner with amplitude and phase detection 2005-08-30
6930770 High throughput inspection system and method for generating transmitted and/or reflected images Emanuel Elyasaf, Simon Yalov, Eitan Lahat 2005-08-16
6853475 Wafer defect detection system with traveling lens multi-beam scanner Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn 2005-02-08
6809808 Wafer defect detection system with traveling lens multi-beam scanner Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn 2004-10-26
6794625 Dynamic automatic focusing method and apparatus using interference patterns 2004-09-21
6750436 Focus error detection apparatus and method having dual focus error detection path Boris Golberg, Alexander Libinson 2004-06-15
6671098 Scanning angle expander and a method for expanding a scanning beam angle 2003-12-30
6124924 Focus error correction method and apparatus Ron Naftali, Gilad Almogy, Amir Komeem 2000-09-26