Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for the examination of specimen

Method and system for the examination of specimen

US Patent 7800062 · Granted Sep 21, 2010

Estimated economic value: $8,059,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias vo2023
Charged particle beam apparatus and method of controlling sample charge2023
Detecting system for detecting distant objects2022
Charged particle beam apparatus, scanning electron microscope, and method of ope2022
Objective lens arrangement2022
High performance inspection scanning electron microscope device and method of op2019
Apparatus and method for image-based positioning, orientation and situational aw2019
On-axis illumination and alignment for charge control during charged particle be2019
Inspection of a lithographic mask that is protected by a pellicle2018
System for discharging an area that is scanned by an electron beam2018
Multi mode systems with retractable detectors2018
Method for targeted resource virtualization in containers2018