Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11598633 | Analyzing a buried layer of a sample | Gal Bruner, Yehuda Zur | 2023-03-07 |
| 11315754 | Adaptive geometry for optimal focused ion beam etching | Ilya Blayvas, Gal Bruner, Yehuda Zur, Ron Davidescu, Kfir Dotan +1 more | 2022-04-26 |
| 11280749 | Holes tilt angle measurement using FIB diagonal cut | Yehuda Zur | 2022-03-22 |