Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7990546 | High throughput across-wafer-variation mapping | Jeong-Ho Yeo, Efrat Rosenman, Doron Meshulach, Gadi Greenberg, Kobi Kan +2 more | 2011-08-02 |
| 7760347 | Design-based method for grouping systematic defects in lithography pattern writing system | Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Rinat Shishi, Vicky Svidenko +2 more | 2010-07-20 |
| 7760929 | Grouping systematic defects with feedback from electrical inspection | Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Rinat Shimshi +1 more | 2010-07-20 |
| 6256093 | On-the-fly automatic defect classification for substrates using signal attributes | Ido Holcman, Vladimir Mikolinsky | 2001-07-03 |