Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7760347 | Design-based method for grouping systematic defects in lithography pattern writing system | Youval Nehmadi, Ariel Ben-Porath, Erez Ravid, Rinat Shishi, Vicky Svidenko +2 more | 2010-07-20 |
| 7760929 | Grouping systematic defects with feedback from electrical inspection | Jacob J Orbon, Youval Nehmadi, Ariel Ben-Porath, Erez Ravid, Rinat Shimshi +1 more | 2010-07-20 |
| 7135344 | Design-based monitoring | Youval Nehmadi, Josephine Phua, Jacob J Orbon, Ariel Ben-Porath, Evgeny Levin | 2006-11-14 |