RS

Rinat Shishi

Applied Materials: 1 patents #4,780 of 7,310Top 70%
Overall (All Time): #3,296,321 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7760347 Design-based method for grouping systematic defects in lithography pattern writing system Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Vicky Svidenko +2 more 2010-07-20