| 9843494 |
Channel availability checks with device monitoring |
Mark W. Casebolt, Peter Hoang, David W. Russo |
2017-12-12 |
| 8924904 |
Method and apparatus for determining factors for design consideration in yield analysis |
Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlah |
2014-12-30 |
| 8893308 |
Counterfeit prevention for optical media |
Darko Kirovski |
2014-11-18 |
| 8799831 |
Inline defect analysis for sampling and SPC |
Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlal |
2014-08-05 |
| 8049521 |
Solar parametric testing module and processes |
Danny Cam Toan Lu, Michel Marriott, Dapeng Wang, Michel R. Frei |
2011-11-01 |
| 7962864 |
Stage yield prediction |
Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlal |
2011-06-14 |
| 7956337 |
Scribe process monitoring methodology |
Tzay-Fa Su, Chuck Luu |
2011-06-07 |
| 7937179 |
Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects |
Rinat Shimshi, Youval Nehmadi, Alexander T. Schwarm, Sundar Jawaharlal |
2011-05-03 |
| 7844101 |
System and method for performing post-plating morphological Cu grain boundary analysis |
Lior Levin |
2010-11-30 |
| 7760347 |
Design-based method for grouping systematic defects in lithography pattern writing system |
Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Rinat Shishi +2 more |
2010-07-20 |
| 7760929 |
Grouping systematic defects with feedback from electrical inspection |
Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid +1 more |
2010-07-20 |
