Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9843494 | Channel availability checks with device monitoring | Mark W. Casebolt, Peter Hoang, David W. Russo | 2017-12-12 |
| 8924904 | Method and apparatus for determining factors for design consideration in yield analysis | Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlah | 2014-12-30 |
| 8893308 | Counterfeit prevention for optical media | Darko Kirovski | 2014-11-18 |
| 8799831 | Inline defect analysis for sampling and SPC | Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlal | 2014-08-05 |
| 8049521 | Solar parametric testing module and processes | Danny Cam Toan Lu, Michel Marriott, Dapeng Wang, Michel R. Frei | 2011-11-01 |
| 7962864 | Stage yield prediction | Youval Nehmadi, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlal | 2011-06-14 |
| 7956337 | Scribe process monitoring methodology | Tzay-Fa Su, Chuck Luu | 2011-06-07 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Rinat Shimshi, Youval Nehmadi, Alexander T. Schwarm, Sundar Jawaharlal | 2011-05-03 |
| 7844101 | System and method for performing post-plating morphological Cu grain boundary analysis | Lior Levin | 2010-11-30 |
| 7760347 | Design-based method for grouping systematic defects in lithography pattern writing system | Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Rinat Shishi +2 more | 2010-07-20 |
| 7760929 | Grouping systematic defects with feedback from electrical inspection | Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid +1 more | 2010-07-20 |