Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8799831 | Inline defect analysis for sampling and SPC | Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Alexander T. Schwarm | 2014-08-05 |
| 7962864 | Stage yield prediction | Youval Nehmadi, Rinat Shimshi, Vicky Svidenko, Alexander T. Schwarm | 2011-06-14 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Rinat Shimshi, Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm | 2011-05-03 |