| 8924904 |
Method and apparatus for determining factors for design consideration in yield analysis |
Vicky Svidenko, Youval Nehmadi, Alexander T. Schwarm, Sundar Jawaharlah |
2014-12-30 |
| 8799831 |
Inline defect analysis for sampling and SPC |
Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal |
2014-08-05 |
| 8688398 |
Method and apparatus for robot calibrations with a calibrating device |
Vijay K. Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Marvin L. Freeman +2 more |
2014-04-01 |
| 8335582 |
Software application to analyze event log and chart tool fail rate as function of chamber and recipe |
— |
2012-12-18 |
| 8260461 |
Method and system for robot calibrations with a camera |
Sekar Krishnasamy, Vijay K. Sakhare, Mordechai Leska, Donald Foldenauer, Satish Sundar |
2012-09-04 |
| 8224607 |
Method and apparatus for robot calibrations with a calibrating device |
Vijay K. Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Marvin L. Freeman +2 more |
2012-07-17 |
| 7962864 |
Stage yield prediction |
Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal |
2011-06-14 |
| 7937179 |
Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects |
Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal |
2011-05-03 |
| 7760929 |
Grouping systematic defects with feedback from electrical inspection |
Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid +1 more |
2010-07-20 |
