Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7760347 | Design-based method for grouping systematic defects in lithography pattern writing system | Youval Nehmadi, Ofer Bokobza, Erez Ravid, Rinat Shishi, Vicky Svidenko +2 more | 2010-07-20 |
| 7760929 | Grouping systematic defects with feedback from electrical inspection | Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Erez Ravid, Rinat Shimshi +1 more | 2010-07-20 |
| 7587700 | Process monitoring system and method for processing a large number of sub-micron measurement targets | Youval Nehmadi, Zamir Abraham, Gil Sod-Moriah, Yair Eran, Chen Ofek +1 more | 2009-09-08 |
| 7217579 | Voltage contrast test structure | Douglas Ray Hendricks | 2007-05-15 |
| 7135344 | Design-based monitoring | Youval Nehmadi, Josephine Phua, Jacob J Orbon, Evgeny Levin, Ofer Bokobza | 2006-11-14 |
| 6987873 | Automatic defect classification with invariant core classes | Mark Wagner | 2006-01-17 |
| 6922482 | Hybrid invariant adaptive automatic defect classification | — | 2005-07-26 |
| 6673657 | Kill index analysis for automatic defect classification in semiconductor wafers | Ayelet Pnueli | 2004-01-06 |
| 6670610 | System and method for directing a miller | Dror Shemesh, Dubi Shachal, Alexey Stepanov | 2003-12-30 |
| 6605478 | Kill index analysis for automatic defect classification in semiconductor wafers | Ayelet Pnueli | 2003-08-12 |