Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7587700 | Process monitoring system and method for processing a large number of sub-micron measurement targets | Youval Nehmadi, Zamir Abraham, Yair Eran, Chen Ofek, Yaron Cohen +1 more | 2009-09-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7587700 | Process monitoring system and method for processing a large number of sub-micron measurement targets | Youval Nehmadi, Zamir Abraham, Yair Eran, Chen Ofek, Yaron Cohen +1 more | 2009-09-08 |