YN

Youval Nehmadi

Applied Materials: 9 patents #1,414 of 7,310Top 20%
VS Vayavision Sensing: 9 patents #1 of 10Top 10%
UN Unknown: 2 patents #12,644 of 83,584Top 20%
BN Ben-Gurion University Of The Negev: 1 patents #8 of 48Top 20%
Overall (All Time): #179,166 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12428020 Functional safety in autonomous driving Shmuel Mangan, Mark Wagner 2025-09-30
12399280 System and method for performing active distance measurements Ronny Cohen, Shmuel Mangan, Zvi Nezer, Moshe Langer 2025-08-26
12352591 Apparatus for acquiring 3-dimensional maps of a scene Shmuel Ur, Ronny Cohen 2025-07-08
12093834 Methods and systems for training and validating a perception system Shahar Ben Ezra, Shmuel Mangan, Mark Wagner, Anna Cohen, Itzik Avital 2024-09-17
11725956 Apparatus for acquiring 3-dimensional maps of a scene Shmuel Ur, Ronny Cohen 2023-08-15
11668830 System and method for performing active distance measurements Ronny Cohen, Shmuel Mangan, Zvi Nezer, Moshe Langer 2023-06-06
11604277 Apparatus for acquiring 3-dimensional maps of a scene Shmuel Ur, Ronny Cohen 2023-03-14
11292483 Managing a change in a physical property of a vehicle due to an external object Ronny Cohen, Mark Wagner, Moshe Langer 2022-04-05
11226413 Apparatus for acquiring 3-dimensional maps of a scene Shmuel Ur, Ronny Cohen 2022-01-18
10445928 Method and system for generating multidimensional maps of a scene using a plurality of sensors of various types Shmuel Mangan, Shahar Ben-Ezra, Anna Cohen, Ronny Cohen, Lev GOLDENTOUCH +1 more 2019-10-15
10444357 System and method for optimizing active measurements in 3-dimensional map generation Shmuel Ur, Ronny Cohen 2019-10-15
10024965 Generating 3-dimensional maps of a scene using passive and active measurements Shmuel Ur, Ronny Cohen 2018-07-17
9424690 Method for translating the location, orientation and movement of a predefined object into computer generated data Dafna Danon 2016-08-23
9303989 System and method for providing 3D imaging Hugo Guterman 2016-04-05
8924904 Method and apparatus for determining factors for design consideration in yield analysis Vicky Svidenko, Rinat Shimshi, Alexander T. Schwarm, Sundar Jawaharlah 2014-12-30
8799831 Inline defect analysis for sampling and SPC Rinat Shimshi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal 2014-08-05
7962864 Stage yield prediction Rinat Shimshi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal 2011-06-14
7937179 Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects Rinat Shimshi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal 2011-05-03
7856138 System, method and computer software product for inspecting charged particle responsive resist Ovadya Menadeva, Sergey Latinsky, Zamir Abraham, Orit Afek 2010-12-21
7760929 Grouping systematic defects with feedback from electrical inspection Jacob J Orbon, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Rinat Shimshi +1 more 2010-07-20
7760347 Design-based method for grouping systematic defects in lithography pattern writing system Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Rinat Shishi, Vicky Svidenko +2 more 2010-07-20
7587700 Process monitoring system and method for processing a large number of sub-micron measurement targets Zamir Abraham, Gil Sod-Moriah, Yair Eran, Chen Ofek, Yaron Cohen +1 more 2009-09-08
7135344 Design-based monitoring Josephine Phua, Jacob J Orbon, Ariel Ben-Porath, Evgeny Levin, Ofer Bokobza 2006-11-14