Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7856138 | System, method and computer software product for inspecting charged particle responsive resist | Youval Nehmadi, Ovadya Menadeva, Sergey Latinsky, Orit Afek | 2010-12-21 |
| 7587700 | Process monitoring system and method for processing a large number of sub-micron measurement targets | Youval Nehmadi, Gil Sod-Moriah, Yair Eran, Chen Ofek, Yaron Cohen +1 more | 2009-09-08 |