Chen Ofek — 1 Patent at Applied Materials

Chen Ofek has been granted 1 US patent while listed as an inventor at Applied Materials. All of these patents were granted in 2009. Chen Ofek ranks #2,406,284 of 4,157,543 US inventors in our database (top 57.9%). Patent records list Chen Ofek in Hadera, IL.

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Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7587700	Process monitoring system and method for processing a large number of sub-micron measurement targets	Youval Nehmadi, Zamir Abraham, Gil Sod-Moriah, Yair Eran, Yaron Cohen +1 more	2009-09-08	$12,578,000

Chen Ofek — 1 Patent

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